Department of Computer Science and Engineering will organize Online Seminar from Portland, Oregon, USA on "Silicon Manufacturing Test and DFT Methodologies." ULAB faculty and students are invited to attend the seminar.

Presented by: Dr. Saffat Quasem

Venue:           Seminar Room, Campus B
Date:             04 November, 2010         
Time:             11:00am

Abstract: 
This seminar will discuss manufacturing test and DFT (Design for Test) methodologies). DFT is a name for design techniques that add certain testability features to silicon design. The added features make it easier to develop and apply manufacturing tests for the designed hardware. The purpose of manufacturing tests is to validate that the product hardware contains no defects that could adversely affect the product’s correct functioning. Tests are applied at several steps in the hardware manufacturing flow and, for certain products, may also be used for hardware maintenance in the customer’s environment. The tests generally are driven by test programs that execute in Automatic Test Equipment (ATE) or, in the case of system maintenance, inside the assembled system itself. In addition to finding and indicating the presence of defects (i.e., the test fails), tests may be able to log diagnostic information about the nature of the encountered test fails. The diagnostic information can be used to locate the source of the failure. DFT plays an important role in the development of test programs and as an interface for test application and diagnostics.